- Introduction
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Aims
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Česká verze
Principal investigator:
Ing. Roman Svoboda, Ph.D.
University of Pardubice, Faculty of Chemical Technology, Department of Physical Chemistry
Tel. 466 037 346, 466 037 420
e-mail roman.svoboda@upce.cz
The proposed project is aimed at detailed and extensive study of phase transformations (mainly the amorphous-to-crystalline conversion) in ultra-thin chalcogenide films under confinement within multilayer environment. First, the methodology for the differential scanning calorimetry (DSC) measurements will be developed and optimized (sensitivity-wise) for the major archetypal phase transformations and model chalcogenide films in as-deposited state (not scraped-off) on different substrates. Secondly, the DSC thermo-kinetic measurements and the supplemental characterization will be performed to analyze how the phase transformations in chalcogenide ultra-thin films are influenced by the film thickness, type of confinement, and internal stress. At this stage, the thin films will be already buffered by technologically relevant supportive layers, the thickness of which will control the internal stress and rigidity. The DSC data will be used to develop a new generation of solid-state kinetic models, accounting for variable activation energy and heterogeneous nucleation/growth domains.
Keywords:
chalcogenides; ultra-thin films; differential scanning calorimetry; crystal growth; phase transformations; solid-state kinetics
Aims
- to develop universal methodology for DSC measurements of ultra-thin chalcogenide films
- to describe how film thickness and internal stress influence phase transformations in chalcogenide films
- to derive complex kinetic models describing phase transformations in multi-layer chalcogenide films